Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
EDN

Cell-aware ATPG test methods improve test quality

Traditional IC pattern-generation methods focus on detectingdefects at gate terminals or at interconnects. Unfortunately, a significantpopulation of defects may occur within an IC's gates, or cells.
GeekWire

Researchers create synthetic proteins that use logic to choose which cells to kill

This stylized schematic shows a Co-LOCKR protein device coming together on the surface of a cell that has the right combination of cell surface markers to be targeted for attack. Check the end of this ...
Hackaday

Who Could Possibly Need An FPGA With 9M Logic Cells And 35B Transistors?

Xilinx recently announced the Virtex UltraScale+ VU19P FPGA. Of course, FPGA companies announce new chips every day. The reason this one caught our attention is the size of it: nearly 9 million logic ...
Electronic Design

Testing Challenges of a Multicore Microprocessor

The Cell Broadband Engine is an advanced multicore microprocessor optimized for compute-intensive workloads and various broadband media applications including computer entertainment, movies, and other ...