Exploded view of a typical benchtop memory tester. Many manufacturers of aerospace products turn to SDRAM and DDR technologies to provide the computational power their systems require. Even though ...

"We are thrilled to introduce the Magnum 7H, a revolutionary memory tester that sets a new standard for testing HBM devices," said Young Kim, President, Memory Test Division, Teradyne. "This ...

TOKYO, March 31, 2020 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has introduced its new versatile, high-throughput H5620 memory tester that ...

Cupertino, Calif.—Verigy has introduced the V5000ep, which allows customers to perform quality assurance, characterization and small lot production at wafer sort and final test on new memory devices.

Teradyne, Inc. (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, is proud to announce the launch of the Magnum 7H, a next-generation memory tester designed to meet ...

T5835 More than Doubles Testing Speed to 5.4 Gbps, Providing High Throughput and Reducing Cost of Test TOKYO, Nov. 30, 2021 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest ...

TOKYO—Semiconductor test equipment supplier Advantest Corporation has announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile ...