IEEE

Operational Testing of 4H-SiC JFET ICs for 60 Days Directly Exposed to Venus Surface ...

Abstract: Prolonged Venus surface missions (lasting months instead of hours) have proven infeasible to date in the absence of a complete suite of electronics able to function for such durations ...
IEEE

V-JFET Transistors for over voltage protection in power device series connected applications

Abstract: Nowadays, MOSFET and IGBT components are widely used in medium and high power converters. They are subjected to increasing requirements: electrical performances, simple implementation, ...
EDN

JFET op-amp advances IC test-and-measurement

Santa Clara, Calif.&#8212NEC Electronics' JFET-class dual operational amplifier for integrated-circuit test applications, the &#956PC835, touts a high slew rate, high capacitive load capability (four ...
Electronic Design

Simple Circuit Turns Scope, Function Generator Into JFET Curve Tracer

Commercial curve tracers have existed for decades. But designers without access to one can create a simple circuit that uses a function generator and oscilloscope to generate JFET transfer and ...