Logic testers are simple but very helpful devices in testing digital circuits. A logic probe can be designed in many different ways. In this particular design, a combination of discrete and TTL logic ...

San Jose, CA – April 16, 2001 – Logic Vision, Inc., an IP provider of embedded test solutions, and Advantest, an automatic test equipment supplier and producer of electronic and optoelectronic ...

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.