Electronic Design

Test Setup Checks Transistors’ hFEs When Tight Control Is Important

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...
GamesRadar+

Transistor Test Challenge Room guide

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Digi Times

Revolutionary dynamic AC test system for power transistors

The revolutionary test technologies in Taurus-PDAT has overcome such difficulties and enables manufacturers of Power MOSFETs and IGBTs to test dynamic AC tests in both characterization and high volume ...
Electronic Design

System-level test contends with billions of untested transistors

Why might you need semiconductor system-level test (SLT)? As Karthik Ranganathan, director for semiconductor solutions at Astronics Test Systems, points out, if you test a 22-nm, ...
EDN

Transistors slim down to test new materials for chip-making processes

Researchers at the IMEC research institute in Belgium are developing a transistor with a gate width of 22nm (0.022µm) and a gate thickness of 0.5nm to test out new materials for future commercial chip ...