The tester shows on a seven-segment, common-cathode display whether its input is logic 1 (H on the display) or Iogic 0 (L on the display). An undefined level is indicated as 'n'.

Logic testers are simple but very helpful devices in testing digital circuits. A logic probe can be designed in many different ways. In this particular design, a combination of discrete and TTL logic ...

elektor july/august 1983 94 1~ C. Bajeux 5 V logic tester The full title for the description of this circuit should be "3 state 5 V logic tester", which at least hints at the fact that this logic ...

When you go on your favorite cheap online shopping platform and order a batch of  74LS logic ICs, what do you get? Most ...

Often, it becomes necessary to interface an existing or new 5V AVR / PIC / MCU project to new devices that use 3.3V logic, like memory cards, sim cards, etc. Described here is a circuit that converts ...

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...

Abstract: A uniform fault model for representing physical defects in components of digital circuits is introduced. Physical defects are modeled as parameters in generic Boolean differential equations.

Abstract: This paper describes an economical approach to highspeed testing of high-density wafer-level packaged logic devices. The solution assumes that the devices to be tested have built-in ...