Abstract: This paper explores the trade-offs of reducing scan test patterns during Wafer Sort, accepting additional packaging costs, and screening more chips during Package Tests. Previous works ...
If you're getting excited to see it for yourself, there isn't much longer to wait. Samsung has just announced its 115" Micro ...
Abstract: Deep neural networks (DNNs) have emerged as an effective approach in many artificial intelligence tasks. Several specialized accelerators are often used to enhance DNN's performance and ...
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